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半导体分立器件

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标准编号 标准名称 状态 发布日期
IEC 62899-503-1 ed1.0 EN Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor 现行 2020-05-27
IEC 62384 ed2.0 EN-FR DC or AC supplied electronic controlgear for LED modules - Performance requirements 现行 2020-05-13
IEC 62384 ed2.0 RLV EN DC or AC supplied electronic controlgear for LED modules - Performance requirements 现行 2020-05-13
IEC 61643-341 ed2.0 EN-FR Components for low-voltage surge protection - Part 341: Performance requirements and test circuits for thyristor surge suppressors (TSS) 现行 2020-05-13
IEC 60191-2-am21 ed1.0 EN Amendment 21 - Mechanical standardization of semiconductor devices - Part 2: Dimensions 现行 2020-02-13
IEC 60747-18-2 ed1.0 EN Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules 现行 2020-02-07
IEC 62779-4 ed1.0 EN-FR Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope 现行 2020-02-07
IEC 60747-19-1 ed1.0 EN Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors 现行 2019-11-22
IEC 62047-35 ed1.0 EN-FR Semiconductor devices – Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible electro-mechanical devices 现行 2019-11-22
IEC 60747-9 ed3.0 EN-FR Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs) 现行 2019-11-13
IEC 60747-5-8 ed1.0 EN-FR Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes 现行 2019-11-13
IEC 60747-14-10 ed1.0 EN-FR Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors 现行 2019-11-13
IEC 60050-523-am1 ed1.0 EN-FR Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical systems (MEMS) 现行 2019-10-17
IEC 60747-7 ed3.1 EN-FR Semiconductor devices - Discrete devices - Part 7: Bipolar transistors 现行 2019-09-23
IEC 60747-7-am1 ed3.0 EN-FR Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors 现行 2019-09-23
IEC 62830-6 ed1.0 EN Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices 现行 2019-07-25
IEC 60747-16-6 ed1.0 EN-FR Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers 现行 2019-06-26
IEC 60749-20-1 ed2.0 EN-FR Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat 现行 2019-06-26
IEC 60749-20-1 ed2.0 RLV EN Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat 现行 2019-06-26
IEC 60747-18-1 ed1.0 EN Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors 现行 2019-05-20
IEC 63150-1 ed1.0 EN-FR Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations 现行 2019-05-10
IEC 62951-6 ed1.0 EN-FR Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films 现行 2019-05-06
IEC 62951-2 ed1.0 EN-FR Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices 现行 2019-04-17
IEC 60749-18 ed2.0 EN-FR Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) 现行 2019-04-10
IEC 60749-18 ed2.0 RLV EN Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) 现行 2019-04-10
IEC 62047-31 ed1.0 EN Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials 现行 2019-04-05
IEC 60749-17 ed2.0 EN-FR Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation 现行 2019-03-28
IEC 62830-4 ed1.0 EN-FR Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices 现行 2019-02-27
IEC 62951-4 ed1.0 EN-FR Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices 现行 2019-02-27
IEC 62951-5 ed1.0 EN-FR Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials 现行 2019-02-27

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