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频率控制和选择用压电器件与介质器

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标准编号 标准名称 状态 发布日期
IEC 60050-561-am2 ed2.0 EN-FR Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection 现行 2020-05-27
IEC 62047-37 ed1.0 EN-FR Semiconductor devices - Micro-electromechanical devices - Part 37: Environmental test methods of MEMS piezoelectric thin films for sensor application 现行 2020-04-28
IEC 63155 ed1.0 EN-FR Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications 现行 2020-04-24
IEC/TS 61994-5 ed1.0 EN Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors 现行 2019-06-26
IEC 62884-4 ed1.0 EN-FR Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods 现行 2019-05-06
IEC 62047-33 ed1.0 EN Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device 现行 2019-04-05
IEC 62047-34 ed1.0 EN Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer 现行 2019-04-05
IEC 62047-36 ed1.0 EN Semiconductor devices – Micro-electromechanical devices – Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films 现行 2019-04-05
IEC 60122-4 ed1.0 EN-FR Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors 现行 2019-01-24
IEC 60444-7 ed1.0 EN_D Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units 现行 暂无
IEC 60444-8 ed1.0 EN_D Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units REVISED 暂无
IEC 60444-9 ed1.0 EN_D Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units 现行 暂无
IEC 60679-1 ed3.0 EN_D Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification REVISED 暂无
IEC 61019-1 ed1.0 EN_D Surface acoustic wave (SAW) resonators - Part 1: Generic specification 现行 暂无
IEC 61019-2 ed2.0 EN_D Surface acoustic wave (SAW) resonators - Part 2: Guide to the use 现行 暂无
IEC 61337-1 ed1.0 EN_D Filters using waveguide type dielectric resonators - Part 1: Generic specification 现行 暂无
IEC 61337-2 ed1.0 EN_D Filters using waveguide type dielectric resonators - Part 2: Guidance for use 现行 暂无
IEC 61338-1 ed1.0 EN_D Waveguide type dielectric resonators - Part 1: Generic specification 现行 暂无
IEC 61338-2 ed1.0 EN_D Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications 现行 暂无
IEC 61338-4 ed1.0 EN_D Waveguide type dielectric resonators - Part 4: Sectional specification 现行 暂无
IEC 61837-4 ed1.0 EN_D Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines REVISED 暂无
IEC 60122-1 ed3.0 EN-FR Quartz crystal units of assessed quality - Part 1: Generic specification 现行 暂无
IEC 60122-2 ed2.0 EN-FR Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection 现行 暂无
IEC 60122-3 ed4.0 EN-FR Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections 现行 暂无
IEC 60368-3 ed4.0 EN-FR Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections 现行 暂无
IEC 60368-4 ed1.0 EN-FR Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval 现行 暂无
IEC 60444-1 ed2.0 EN-FR Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network 现行 暂无
IEC 60444-2 ed1.0 EN-FR Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units 现行 暂无
IEC 60444-5 ed1.0 EN-FR Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction 现行 暂无
IEC 60444-6 ed2.0 EN-FR Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) 现行 暂无
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