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搜索结果: 93 个产品, 第 1 页, 共 4 页
标准编号 标准名称 状态 发布日期
IEC 62228-3 ed1.0 EN-FR Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers 现行 2019-03-11
IEC 62433-1 ed1.0 EN EMC IC modelling - Part 1: General modelling framework 现行 2019-03-08
IEC 61967-1 ed2.0 EN-FR Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions 现行 2018-12-12
IEC 61967-1 ed2.0 RLV EN Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions 现行 2018-12-12
IEC 60748-4-3 ed1.0 EN Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) 现行 暂无
IEC 62433-2 ed1.0 EN_D EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) REVISED 暂无
IEC 60748-1 ed2.0 EN-FR Semiconductor devices - Integrated circuits - Part 1: General 现行 暂无
IEC 60748-2 ed2.0 EN-FR Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits 现行 暂无
IEC 60748-23-1 ed1.0 EN Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification 现行 暂无
IEC 60748-23-2 ed1.0 EN Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests 现行 暂无
IEC 60748-23-3 ed1.0 EN Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report 现行 暂无
IEC 60748-23-4 ed1.0 EN Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification 现行 暂无
IEC 60748-23-5 ed1.0 EN Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval 现行 暂无
IEC 60748-3 ed1.0 EN-FR Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits 现行 暂无
IEC 60748-4 ed2.0 EN-FR Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits 现行 暂无
IEC 60748-5 ed1.0 EN-FR Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits 现行 暂无
IEC 61967-1 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions 现行 暂无
IEC 61967-4 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method 现行 暂无
IEC 61967-4 ed1.1 EN-FR Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method 现行 暂无
IEC 61967-5 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method 现行 暂无
IEC 61967-6 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method 现行 暂无
IEC 61967-6 ed1.1 EN-FR Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method 现行 暂无
IEC 61967-8 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method 现行 暂无
IEC 62132-1 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions REVISED 暂无
IEC 62132-1 ed2.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions 现行 暂无
IEC 62132-2 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method 现行 暂无
IEC 62132-3 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method 现行 暂无
IEC 62132-4 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method 现行 暂无
IEC 62132-5 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method 现行 暂无
IEC 62132-8 ed1.0 EN-FR Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method 现行 暂无
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